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Teaching |
Bruker AXS D8 Advance X-Ray Diffractometer
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The Univeristy of Memphis would like to acknowlege the NSF support (NSF-MRI Grant # 0521226) towards the purchase of the XRD system.
This a state-of-the-art multi-purpose X-Ray diffractometer(XRD) system which is located in the Department of Physics. The purpose of this instrument is to serve individual investigators at the University of Memphis and from neighboring instutes and industies by providing new capabilities in materials science related activities as well as dramatically increasing research productivity.
| X-ray diffraction technique is used to study structural characteristics and to identify powders, thin films and crystals. Data analysis is performed using Materials Data Incorporated's JADE 7.0 software package with whole pattern fitting. Phase identification is possible using ICDD's PDF-4 database. Powderful softwares TOPAZ and LEPTOZ are also available for powder diffraction and thin film study, respectively. | |
| EQUIPMENT | Bruker AXS D8 Advance with Quater crade |
| X-RAY SOURCE | 2.2kW Cu and Co, Running condiction (40kV, 40mA), Power stability is better than 0.01% |
| DETECTORS: | Point detector, Vantec-1 detector |
| OPTICS: | Gobel Mirror |
| GONIOMETER | high precision microprocessor controlled, two circle goniometer with independent stepper motors and optical encoders. Smallest angular step 0.0001o, Reproducibility +/- 0.0001o. |
| SAMPLE STAGE | Centric ¼-Circle Eulerian Cradle.motorized
Chi(tilt) and Phi(rotation) rotations and X-Y-Z translations. The
cradle accommodates bulky specimens, powders, thin-films, and wafers
up to 80 x 50 x 20 mm and weighing up to 1 kg. |
| ATTACHEMENTS: | High Temperature MRI stage (RT-1400C), Thin Film Reflectometry, sample spinner, Video camera, sample plate with 9-sample holders |
| SOFTWARE: | LEPTOZ, TOPAZ, ICCD |